KEYSIGHTCapacitance Meter
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產(chǎn)品名稱: KEYSIGHTCapacitance Meter
產(chǎn)品型號: E4981B , 120 Hz / 1 kHz / 1 MHz
產(chǎn)品展商: KEYSIGHT
產(chǎn)品文檔: 無相關(guān)文檔
簡單介紹
The E4981A capacitance meter offers a high speed with reliable measurements for ceramic capacitor testing in the production lines.
KEYSIGHTCapacitance Meter
的詳細介紹
The E4981A capacitance meter offers a high speed with reliable measurements for ceramic capacitor testing in the production lines.
A New Standard for Ceramic Capacitor Production Tests
The Keysight Technologies, Inc. E4981B capacitance meter provides the best performance for ceramic capacitor manufacturing tests. Offering fast measurement speed and outstanding accuracy, the E4981B is the new standard in the industry.
Measurement Time
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High-speed measurement: 2.3 ms (1 MHz), 3.0 ms (1 kHz), 11.0 ms (120 Hz)
Basic Accuracy
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Accurate C-D testing: 0.05%, 0.0005 (specification), 0.042%, 0.0003 (typical)
More Features
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9 Bin Sorting
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256 multi-channel correction
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Compatible SCPI command and Handler/Scanner interfaces with the 4268A, 4288A, and E4981A
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Test signal level compensation for high-value ceramic capacitor tests
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Versatile PC connectivity (LAN, USB and GPIB)
A complete solution that replaces the 4268A, 4288A, and E4981A
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Fast measurement speed - 2.3 ms (from trigger to EOM at 1 MHz)
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Accurate and repeatable measurements, even small capacitance can be measured
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Wide measurement range from small to large capacitance 0 F to 2.0 mF
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0 F to 1.5 nF/1 MHz
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68 pF to 200 nF/1 kHz
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6.8 nF to 2 mF/120 Hz
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Compatibility with the 4268A, 4288A, and E4981A
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SCPI commands
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Handler I/F
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Scanner I/F
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Enhanced functions for production test
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Enhanced contact failure detections
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Synchronous source
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Frequency shift (±1%, ±2%) at 1 MHz
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Faster data transfer
The E4981B capacitance meter offers a high speed with reliable measurements for ceramic capacitor testing in the production lines. The E4981B realizes the measurement capabilities of capacitance from small to large values with accurate measurements. The E4981B capacitance meter contributes to improvements in the test throughput while attaining excellent component quality for ceramic capacitor testing.